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Electrical Characterisation
A microprobe station is used to physically acquire signals from the internal nodes of a semiconductor device. The probe station utilizes manipulators which allow the precise positioning of thin needles on the surface of a semiconductor device. If the device is being electrically stimulated, the signal is acquired by the microprobe and is displayed on an oscilloscope or SMU . The microprobe station is often used in the failure analysis of semiconductor devices.